# HTS 9031: Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof:

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Source: [2026 HTS Revision 21 (October 9, 2026)](https://hts.usitc.gov/search?query=9031). Additional duties by country of origin may apply; estimate a shipment's full duty with the tariff calculator: https://geopax.app/tariffs/calculator

## 9031: Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof:

| Code | Description | General | Special | Column 2 | Units |
| --- | --- | --- | --- | --- | --- |
| 9031 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: |  |  |  |  |
| 9031.10.00.00 |   Machines for balancing mechanical parts | Free |  | 40% | No. |
| 9031.20.00.00 |   Test benches | 1.7% | Free (A*,AU,BH,CL,CO,D,E,IL,JO,KR,MA,OM,P,PA,PE,S,SG) | 45% | No. |
|  |   Other optical instruments and appliances: |  |  |  |  |
| 9031.41.00 |     For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | Free |  | 50% |  |
| 9031.41.00.20 |       For inspecting photomasks or reticles used in manufacturing semiconductor devices | Free |  | 50% | No. |
|  |       For inspecting semiconductor wafers or devices: | Free |  | 50% |  |
| 9031.41.00.40 |         For wafers | Free |  | 50% | No. |
| 9031.41.00.60 |         Other | Free |  | 50% | No. |
| 9031.49 |     Other: |  |  |  |  |
| 9031.49.10.00 |       Profile projectors | Free |  | 45% | No. |
| 9031.49.40.00 |       Coordinate-measuring machines | Free |  | 50% | No. |
| 9031.49.70.00 |       For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | Free |  | 50% | No. |
| 9031.49.90.00 |       Other | Free |  | 50% | No. |
| 9031.80 |   Other instruments, appliances and machines: |  |  |  |  |
| 9031.80.40.00 |     Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | Free |  | 40% | No. |
| 9031.80.80 |     Other | Free |  | 40% |  |
|  |       Equipment for testing the characteristics of internal combustion engines: | Free |  | 40% |  |
| 9031.80.80.60 |         For testing electrical characteristics | Free |  | 40% | kg |
| 9031.80.80.70 |         Other | Free |  | 40% | kg |
| 9031.80.80.85 |       Other | Free |  | 40% | kg |
| 9031.90 |   Parts and accessories: |  |  |  |  |
| 9031.90.21.00 |     Of profile projectors | Free |  | 45% | kg |
|  |     Of other optical instruments and appliances, other than test benches: |  |  |  |  |
| 9031.90.45.00 |       Bases and frames for the coordinate-measuring machines of subheading 9031.49.40 | Free |  | 50% | kg |
| 9031.90.54.00 |       Of optical instruments and appliances of subheading 9031.41 or 9031.49.70 | Free |  | 50% | kg |
| 9031.90.59.00 |       Other | Free |  | 50% | kg |
|  |     Other: |  |  |  |  |
| 9031.90.70.00 |       Of articles of subheading 9031.80.40 | Free |  | 40% | kg |
| 9031.90.91 |       Other | Free |  | 40% |  |
| 9031.90.91.30 |         Of machines for balancing mechanical parts | Free |  | 40% | kg |
| 9031.90.91.60 |         Of test benches | Free |  | 40% | kg |
| 9031.90.91.95 |         Other | Free |  | 40% | kg |