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HTS 9031Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof

Rate lines21

DescriptionCalculate
9031.10.00.00Machines for balancing mechanical partsGeneral Free · Column 2 40% · No.
9031.20.00.00Test benchesGeneral 1.7% · Special Free (A*,AU,BH,CL,CO,D,E,IL,JO,KR,MA,OM,P,PA,PE,S,SG) · Column 2 45% · No.
Other optical instruments and appliances
9031.41.00For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)General Free · Column 2 50%
9031.41.00.20For inspecting photomasks or reticles used in manufacturing semiconductor devicesGeneral Free · Column 2 50% · No.
For inspecting semiconductor wafers or devicesGeneral Free · Column 2 50%
9031.41.00.40For wafersGeneral Free · Column 2 50% · No.
9031.41.00.60OtherGeneral Free · Column 2 50% · No.
9031.49Other
9031.49.10.00Profile projectorsGeneral Free · Column 2 45% · No.
9031.49.40.00Coordinate-measuring machinesGeneral Free · Column 2 50% · No.
9031.49.70.00For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devicesGeneral Free · Column 2 50% · No.
9031.49.90.00OtherGeneral Free · Column 2 50% · No.
9031.80Other instruments, appliances and machines
9031.80.40.00Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticlesGeneral Free · Column 2 40% · No.
9031.80.80OtherGeneral Free · Column 2 40%
Equipment for testing the characteristics of internal combustion enginesGeneral Free · Column 2 40%
9031.80.80.60For testing electrical characteristicsGeneral Free · Column 2 40% · kg
9031.80.80.70OtherGeneral Free · Column 2 40% · kg
9031.80.80.85OtherGeneral Free · Column 2 40% · kg
9031.90Parts and accessories
9031.90.21.00Of profile projectorsGeneral Free · Column 2 45% · kg
Of other optical instruments and appliances, other than test benches
9031.90.45.00Bases and frames for the coordinate-measuring machines of subheading 9031.49.40General Free · Column 2 50% · kg
9031.90.54.00Of optical instruments and appliances of subheading 9031.41 or 9031.49.70General Free · Column 2 50% · kg
9031.90.59.00OtherGeneral Free · Column 2 50% · kg
Other
9031.90.70.00Of articles of subheading 9031.80.40General Free · Column 2 40% · kg
9031.90.91OtherGeneral Free · Column 2 40%
9031.90.91.30Of machines for balancing mechanical partsGeneral Free · Column 2 40% · kg
9031.90.91.60Of test benchesGeneral Free · Column 2 40% · kg
9031.90.91.95OtherGeneral Free · Column 2 40% · kg

Duty by country of origin

Rate lineGermany16.61% of importsMexico13.87% of importsJapan11.28% of importsCanada8.23% of importsChina5.38% of importsUnited Kingdom4.37% of importsSouth Korea3.55% of importsSwitzerland3.41% of importsIsrael3.4% of importsTaiwan3.33% of imports
9031.10.00.00Machines for balancing mechanical parts10%9903.05.3910%9903.05.5512.5%9903.05.4910%9903.05.2937.5%9903.05.319903.88.0110%9903.05.8112.5%9903.05.7112.5%9903.05.7412.5%9903.05.4710%9903.05.76
9031.20.00.00Test benches10%9903.05.3911.7%9903.05.5512.5%9903.05.4911.7%9903.05.2939.2%9903.05.319903.88.0111.7%9903.05.8112.5%9903.05.7112.5%9903.05.7414.2%9903.05.4710%9903.05.76
9031.41.00.20For inspecting photomasks or reticles used in manufacturing semiconductor devices0%0%0%0%25%9903.88.010%0%0%0%0%
9031.41.00.40For wafers0%0%0%0%25%9903.88.010%0%0%0%0%
9031.41.00.60Other0%0%0%0%25%9903.88.010%0%0%0%0%
9031.49.10.00Profile projectors10%9903.05.3910%9903.05.5512.5%9903.05.4910%9903.05.2937.5%9903.05.319903.88.0110%9903.05.8112.5%9903.05.7112.5%9903.05.7412.5%9903.05.4710%9903.05.76
9031.49.40.00Coordinate-measuring machines10%9903.05.3910%9903.05.5512.5%9903.05.4910%9903.05.2937.5%9903.05.319903.88.0110%9903.05.8112.5%9903.05.7112.5%9903.05.7412.5%9903.05.4710%9903.05.76
9031.49.70.00For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices0%0%0%0%25%9903.88.010%0%0%0%0%
9031.49.90.00Other10%9903.05.3910%9903.05.5512.5%9903.05.4960%9903.05.299903.03.1437.5%9903.05.319903.88.0110%9903.05.8112.5%9903.05.7112.5%9903.05.7412.5%9903.05.4710%9903.05.76
9031.80.40.00Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles0%0%0%0%25%9903.88.010%0%0%0%0%
9031.80.80.60For testing electrical characteristics10%9903.05.3910%9903.05.5512.5%9903.05.4910%9903.05.2937.5%9903.05.319903.88.0110%9903.05.8112.5%9903.05.7112.5%9903.05.7412.5%9903.05.4710%9903.05.76
9031.80.80.70Other10%9903.05.3910%9903.05.5512.5%9903.05.4910%9903.05.2937.5%9903.05.319903.88.0110%9903.05.8112.5%9903.05.7112.5%9903.05.7412.5%9903.05.4710%9903.05.76
9031.80.80.85Other10%9903.05.3910%9903.05.5512.5%9903.05.4910%9903.05.2937.5%9903.05.319903.88.0110%9903.05.8112.5%9903.05.7112.5%9903.05.7412.5%9903.05.4710%9903.05.76
9031.90.21.00Of profile projectors10%9903.05.3910%9903.05.5512.5%9903.05.4910%9903.05.2937.5%9903.05.319903.88.0110%9903.05.8112.5%9903.05.7112.5%9903.05.7412.5%9903.05.4710%9903.05.76
9031.90.45.00Bases and frames for the coordinate-measuring machines of subheading 9031.49.400%0%0%0%25%9903.88.030%0%0%0%0%
9031.90.54.00Of optical instruments and appliances of subheading 9031.41 or 9031.49.700%0%0%0%25%9903.88.010%0%0%0%0%
9031.90.59.00Other10%9903.05.3910%9903.05.5512.5%9903.05.4910%9903.05.2937.5%9903.05.319903.88.0110%9903.05.8112.5%9903.05.7112.5%9903.05.7412.5%9903.05.4710%9903.05.76
9031.90.70.00Of articles of subheading 9031.80.400%0%0%0%25%9903.88.010%0%0%0%0%
9031.90.91.30Of machines for balancing mechanical parts10%9903.05.3910%9903.05.5512.5%9903.05.4910%9903.05.29From 37.5%9903.05.319903.88.01AD/CVD may apply10%9903.05.8112.5%9903.05.7112.5%9903.05.7412.5%9903.05.4710%9903.05.76
9031.90.91.60Of test benches10%9903.05.3910%9903.05.5512.5%9903.05.4910%9903.05.29From 37.5%9903.05.319903.88.01AD/CVD may apply10%9903.05.8112.5%9903.05.7112.5%9903.05.7412.5%9903.05.4710%9903.05.76
9031.90.91.95OtherFrom 10%9903.05.39Depends on product factsFrom 10%9903.05.55Depends on product factsFrom 12.5%9903.05.49Depends on product factsFrom 10%9903.05.29Depends on product factsFrom 37.5%9903.05.319903.88.01Depends on product factsAD/CVD may applyFrom 10%9903.05.81Depends on product factsFrom 12.5%9903.05.71Depends on product factsFrom 12.5%9903.05.74Depends on product factsFrom 12.5%9903.05.47Depends on product factsFrom 10%9903.05.76Depends on product facts
Total duty on a $10,000 ocean shipment entered 2026-10-13, before customs fees. Origins are the leading sources of US imports under this heading in 2025 (US Census Bureau).